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Found: 1

IEC 60512-6-2:2002

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

Overview The IEC 60512-6-2:2002 standard, published by the International Electrotechnical Commission (IEC), specifies a standardized test method-Test 6b: Bump-to evaluate the durability and robustnes…