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IEC 62047-10:2011/COR1:2012

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Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression t…

IEC 62047-10:2011

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Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS mat…

Overview IEC 62047-10:2011 is an international standard developed by the International Electrotechnical Commission (IEC) that defines a micro-pillar compression test method specifically designed for…