ASTM F1262M-14 PDF

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

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Title (English):

ASTM F1262M-14

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

Document status:: Withdrawn
Format:: Electronic (PDF)
Publication date:: January 11, 2023
SKU:: ASTM F1262M-14

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Abstract

Significance and Use 5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affec...

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ASTM F1262M-14 PDF

Abstract

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