ASTM F1893-18 PDF

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

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Title (English):

ASTM F1893-18

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

Document status:: Withdrawn
Format:: Electronic (PDF)
Publication date:: November 30, 2023
SKU:: ASTM F1893-18

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Abstract

Significance and Use 5.1 The use of FXR or LINAC radiation sources for the determination of high dose-rate burnout in semiconductor devices is addressed in this guide. The goal of this guide is to provide a systematic approach to testing s...

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ASTM F1893-18 PDF

Abstract

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