BS CECC 00013:1985 PDF
Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
Title (English):
BS CECC 00013:1985
Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
- Document status:
- Withdrawn
- Format:
- Electronic (PDF)
- Publication date:
- August 30, 1985
- ICS:
- 31.080.01
- SKU:
- BS CECC 00013:1985