BS EN IEC 60749-12:2018 PDF

Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

Open preview (PDF)Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

Title (English):

BS EN IEC 60749-12:2018

Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

Document status:

Active

Format:

Electronic (PDF)

Publication date:

April 30, 2018

ICS:

31.080.01

Technical committee:

CENELEC

SKU:

BS EN IEC 60749-12:2018