Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere
This site uses cookies and visit counters for operation and statistics. Privacy policy
What is BS EN IEC 60749-13 – Salt atmosphere test for semiconductor devices about?
BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749-13 is the 13 th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. BS EN IEC 60749-13 is only applicable to those dev...
Mentioned in the description and other BS standards
