BS EN IEC 60749-15:2020 PDF

Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices

Open preview (PDF)Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices

Title (English):

BS EN IEC 60749-15:2020

Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices

Document status:

Active

Format:

Electronic (PDF)

Publication date:

September 30, 2020

ICS:

31.080.01

SKU:

BS EN IEC 60749-15:2020