Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation
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What is BS EN IEC 60749 ‑ 17 about?
BS EN IEC 60749 ‑ 17 is the 17th part of an international standard that covers the attributes of semiconductor devices. This specifies the neutron irradiation test method for determining the degradation parameters of critical semiconductor devices. BS EN IEC 60749 ‑ 17 specifies the neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. It gives technical specifications such as related terms and definitions, test apparatus, test procedure, safety requirements, etc.
Mentioned in the description and other BS standards
