BS EN IEC 60749-20:2020 PDF

Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

First page of standard BS EN IEC 60749-20:2020

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Title (English):

BS EN IEC 60749-20:2020

Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Document status:: Active
Format:: Electronic (PDF)
Publication date:: October 31, 2020
ICS:: 31.080.01
SKU:: BS EN IEC 60749-20:2020

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Abstract

What is BS EN IEC 60749 ‑ 20 about?

BS EN IEC 60749 ‑ 20 is the 20th part of semiconductor the multi-series European standard on semiconductor devices. BS EN IEC 60749 ‑ 20 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.

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Mentioned in the description and other BS standards

BS EN IEC 60749-20:2020 PDF

Abstract

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Abstract

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