BS EN IEC 60749-30:2020 PDF

Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing

Open preview (PDF)Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing

Title (English):

BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing

Document status:

Active

Format:

Electronic (PDF)

Publication date:

September 30, 2020

ICS:

31.080.01

SKU:

BS EN IEC 60749-30:2020