BS EN IEC 60749-41:2020 PDF

Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices

Open preview (PDF)Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices

Title (English):

BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices

Document status:

Active

Format:

Electronic (PDF)

Publication date:

September 30, 2020

ICS:

31.080.01

Technical committee:

CENELEC

SKU:

BS EN IEC 60749-41:2020