BS EN IEC 63616:2026 PDF

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Open preview (PDF)Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Title (English):

BS EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Document status:

Active

Format:

Electronic (PDF)

Publication date:

January 31, 2026

ICS:

17.220.20

Technical committee:

CENELEC

SKU:

BS EN IEC 63616:2026