BS EN ISO 9220:1995 PDF

Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Title (English):

BS EN ISO 9220:1995

Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Document status:: Withdrawn
Format:: Electronic (PDF)
Publication date:: September 29, 1989
ICS:: 17.040.20
Technical committee:: CEN
SKU:: BS EN ISO 9220:1995

Document language:

enru

Delivery time:1–7 days

Price:194 €

Abstract

1 Scope This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope (SEM). It is destructive and has an uncertainty of less than 10 % or 0,1 4m, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope (ISO 1463) when applicable.

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Mentioned in the description and other BS standards

BS EN ISO 9220:1995 PDF

Abstract

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Abstract

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