BS IEC 60747-14-11:2021 PDF

Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

First page of standard BS IEC 60747-14-11:2021

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Title (English):

BS IEC 60747-14-11:2021

Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

Document status:: Active
Format:: Electronic (PDF)
Publication date:: March 31, 2021
ICS:: 31.080.01
SKU:: BS IEC 60747-14-11:2021

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Abstract

What is BS IEC 60747 ‑ 14 ‑ 11 about?

BS IEC 60747 ‑ 14 ‑ 11 is the 14th part of the multi-series European standard that defines the terms, definitions, configuration, and test methods that can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods described in BS IEC 60747 ‑ 14 ‑ 11 are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. Note: This BS IEC 60747 ‑ 14 ‑ 11 excludes devices dealt with by TC 49: piezoelectric, dielectric, and electrostatic devices and...

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What is BS IEC 60747 ‑ 14 ‑ 11 about?

BS IEC 60747-14-11:2021 PDF

Abstract

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Abstract

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