BS IEC 60747-18-1:2019 PDF

Semiconductor devices - Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

First page of standard BS IEC 60747-18-1:2019

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Title (English):

BS IEC 60747-18-1:2019

Semiconductor devices - Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Format:: Electronic (PDF)
Publication date:: June 30, 2019
ICS:: 31.080.99
Technical committee:: CENELEC
SKU:: BS IEC 60747-18-1:2019

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Abstract

What is BS IEC 60747 ‑ 18 ‑ 1 - Calibration of lens-free CMOS photonic array sensors about?

BS IEC 60747 is a series of the international standard used for semiconductor devices that have their electrical conductivities lying between that of good conductors and insulators. BS IEC 60747 ‑ 18 ‑ 1 is one of the parts of the BS IEC 60747 series of documents that specifies the test methods and data analysis for calibration of lens-free CMOS photonic array sensors. BS IEC 60747 ‑ 18 ‑ 1 is useful in measuring and evaluating the parameters for the calibration of lens-free CMOS photonic array sensors that are used in semiconductor devices.

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BS IEC 60747-18-1:2019 PDF

Abstract

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Abstract

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