BS IEC 60747-5-14:2022 PDF

Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method

First page of standard BS IEC 60747-5-14:2022

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Title (English):

BS IEC 60747-5-14:2022

Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method

Document status:: Active
Format:: Electronic (PDF)
Publication date:: September 30, 2024
ICS:: 31.080.99
SKU:: BS IEC 60747-5-14:2022

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Abstract

1 Scope This part of IEC 60747‑5 specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.

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BS IEC 60747-5-14:2022 PDF

Abstract

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Abstract

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