BS IEC 62047-34:2019 PDF

Semiconductor devices. Micro-electromechanical devices - Test methods for MEMS piezoresistive pressure-sensitive device on wafer

First page of standard BS IEC 62047-34:2019

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Title (English):

BS IEC 62047-34:2019

Semiconductor devices. Micro-electromechanical devices - Test methods for MEMS piezoresistive pressure-sensitive device on wafer

Document status:: Active
Format:: Electronic (PDF)
Publication date:: April 30, 2019
ICS:: 31.080.99
Technical committee:: CENELEC
SKU:: BS IEC 62047-34:2019

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Abstract

What is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices about?

BS IEC 62047-34 is the thirty-fourth part of the Semiconductor devices and microelectromechanical devices that specifies the test methods and test procedures for MEMS piezoresistive pressure-sensitive devices on wafers. By using BS IEC 62047-34 you can manufacture good quality microelectromechanical devices. BS IEC 62047-34 describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. BS IEC 62047-34 applies to both open and closed loop piezoresistive MEMS pressure devices on the wafer.

Who is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices for?

BS IEC 62047-34 Semiconductor devices are beneficial for:

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Other BS standards

What is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices about?

Who is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices for?

BS IEC 62047-34 Semiconductor devices are beneficial for:

BS IEC 62047-34:2019 PDF

Abstract

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Abstract

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