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BS IEC 62047-37:2020 PDF

Semiconductor devices. Micro-electromechanical devices - Environmental test methods of MEMS piezoelectric thin films for sensor application

First page of standard BS IEC 62047-37:2020Open preview (PDF)Semiconductor devices. Micro-electromechanical devices - Environmental test methods of MEMS piezoelectric thin films for sensor application
Title (English):
BS IEC 62047-37:2020

Semiconductor devices. Micro-electromechanical devices - Environmental test methods of MEMS piezoelectric thin films for sensor application

Document status:
Active
Format:
Electronic (PDF)
Publication date:
April 30, 2023
ICS:
31.080.01
SKU:
BS IEC 62047-37:2020

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