BS IEC 62047-40:2021 PDF

Semiconductor devices. Micro-electromechanical devices - Test methods of micro-electromechanical inertial shock switch threshold

Open preview (PDF)Semiconductor devices. Micro-electromechanical devices - Test methods of micro-electromechanical inertial shock switch threshold

Title (English):

BS IEC 62047-40:2021

Semiconductor devices. Micro-electromechanical devices - Test methods of micro-electromechanical inertial shock switch threshold

Document status:

Active

Format:

Electronic (PDF)

Publication date:

September 30, 2021

ICS:

31.080.99

SKU:

BS IEC 62047-40:2021