BS IEC 62047-43:2024 PDF

Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Open preview (PDF)Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Title (English):

BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Document status:

Active

Format:

Electronic (PDF)

Publication date:

March 31, 2024

ICS:

31.080.99

SKU:

BS IEC 62047-43:2024