BS IEC 62951-6:2019 PDF

Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films

First page of standard BS IEC 62951-6:2019

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Title (English):

BS IEC 62951-6:2019

Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films

Document status:: Active
Format:: Electronic (PDF)
Publication date:: May 31, 2019
ICS:: 31.080.99
SKU:: BS IEC 62951-6:2019

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Abstract

What is BS IEC 62951 ‑ 6 - Semiconductor devices about?

BS IEC 62951-6 is the sixth part of an International Standard used for Semiconductor devices. BS IEC 62951-6 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Who is BS IEC 62951-6 - Semiconductor devices for?

BS IEC 62951-6 Semiconductor devices are beneficial for:

Semiconductor foundries

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BS IEC 62951-6:2019 PDF

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