BS IEC 63003:2015 PDF

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM

Open preview (PDF)Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM

Title (English):

BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM

Document status:

Active

Format:

Electronic (PDF)

Publication date:

January 31, 2016

ICS:

25.040.01

SKU:

BS IEC 63003:2015