BS ISO 11505:2012 PDF

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

First page of standard BS ISO 11505:2012

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Title (English):

BS ISO 11505:2012

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Document status:: Withdrawn
Format:: Electronic (PDF)
Publication date:: January 31, 2013
ICS:: 71.040.40
SKU:: BS ISO 11505:2012

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Abstract

1 Scope This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.

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BS ISO 11505:2012 PDF

Abstract

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Abstract

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