BS ISO 16129:2012 PDF

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

First page of standard BS ISO 16129:2012

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Title (English):

BS ISO 16129:2012

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Document status:: Withdrawn
Format:: Electronic (PDF)
Publication date:: December 31, 2012
ICS:: 71.040.40
SKU:: BS ISO 16129:2012

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Abstract

1 Scope This International Standard is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray photoelectron spectrometer. It is not intended to provide an exhaustive performance check, but instead provides a rapid set of tests that can be conducted frequently. Aspects of instrument behaviour covered by this International Standard include the vacuum, measurements of spectra of conductive or non-conductive test specimens and the current state of the X-ray source. Other important aspects of the instrument performance (e.g. lateral resolution) fall outside the scope of this International Standard. The standard is intended for use with commercial X-ray photoelectron spectrometers equipped with a monochromated Al Kα X-ray source or with an unmonochromated Al or Mg Kα X-ray source.

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Abstract

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Abstract

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