BS ISO 20263:2024 PDF

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.

Open preview (PDF)Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.

Title (English):

BS ISO 20263:2024

Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.

Document status:

Active

Format:

Electronic (PDF)

Number of pages:

56

Publication date:

November 19, 2024

SKU:

BS ISO 20263:2024