BS ISO 21222:2020 PDF

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method.

Open preview (PDF)Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method.

Title (English):

BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method.

Document status:

Active

Format:

Electronic (PDF)

Number of pages:

26

Publication date:

February 7, 2020

SKU:

BS ISO 21222:2020