BS ISO 22278:2020 PDF

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam.

Open preview (PDF)Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam.

Title (English):

BS ISO 22278:2020

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam.

Document status:

Active

Format:

Electronic (PDF)

Number of pages:

38

Publication date:

August 26, 2020

SKU:

BS ISO 22278:2020