BS ISO 22489:2016 PDF

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy.

Open preview (PDF)Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy.

Title (English):

BS ISO 22489:2016

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy.

Document status:

Active

Format:

Electronic (PDF)

Number of pages:

26

Publication date:

October 31, 2016

SKU:

BS ISO 22489:2016