BS ISO 24173:2009 PDF

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Open preview (PDF)Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Title (English):

BS ISO 24173:2009

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Document status:

Withdrawn

Format:

Electronic (PDF)

Publication date:

October 31, 2009

ICS:

71.040.50

SKU:

BS ISO 24173:2009