Overview
EN ISO 25178-6:2010 (ISO 25178-6:2010) is part of the ISO 25178 family for Geometrical Product Specifications (GPS) - Surface texture: Areal. This part establishes a clear classification of methods for measuring surface texture, defining three principal classes of measurement methods, illustrating their relationships and briefly describing representative techniques. It provides a framework to help users choose appropriate measurement methods and to identify which subsequent ISO 25178 parts or instrument standards apply.
Key topics
- Classification scheme: Defines three method classes used in surface metrology:
- Line-profiling methods - produce a single profile z(x) (examples: contact stylus, some optical profilers).
- Areal-topography methods - produce a full 3D surface map z(x,y) (examples: interferometric microscopy, confocal microscopy, coherence scanning interferometry, optical triangulation, AFM/SEM variants).
- Area-integrating methods - yield numerical, area-averaged indicators rather than explicit profiles or topographies (examples: total integrated scatter, angle-resolved scatter, capacitance or pneumatic flow techniques).
- Terms and definitions: Aligned with ISO 25178‑2 and ISO 4287 for consistent vocabulary (measurement coordinate system, surface profile, ordinate value).
- Method descriptions: Concise descriptions of specific techniques such as contact stylus scanning and phase‑shifting interferometric microscopy (PSI).
- Metrological considerations: Informative annexes discuss metrological limitations and the relation to the GPS matrix model - useful when assessing method suitability and measurement uncertainty.
- Normative references: Connects to ISO 25178 parts (e.g., -2, -3, -7) and ISO/IEC VIM for metrology concepts.
Applications and who uses it
- Quality and process engineers in automotive, aerospace, medical devices and precision manufacturing choosing appropriate surface texture measurement methods for inspection and product specification.
- Metrology laboratories and calibration houses developing measurement protocols and uncertainty budgets.
- Instrument manufacturers and software developers who classify and document instrument capabilities (stylus, interferometric, confocal, AFM, SEM).
- R&D and standards committees comparing methods or developing further areal texture standards and measurement procedures.
Practical benefits include improved method selection, consistent terminology for areal surface texture, and guidance on when profile, areal, or area‑integrating approaches are appropriate.
Related standards
Keywords: ISO 25178-6, EN ISO 25178-6:2010, surface texture, areal, classification of methods, areal-topography, line-profiling, area-integrating, GPS, surface metrology.
