IEC 60444-6:2021 PDF

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

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Title (English):

IEC 60444-6:2021

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 63
Publication date:: September 1, 2021
Edition:: IEC IS 60444 edition 3 version 1
ICS:: 31.140

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Description (English):

IEC 60444-6:2021 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the p-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the p-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). This edition includes the following significant technical changes with respect to the previous edition: - some equations have been removed and corrected; - it has been specified in the note of the Scope that the measurement methods specified in this document are not only applicable to AT-cut but also to other crystal cuts and vibration modes.

Technical details

Technical committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
SKU: IEC 60444-6:2021

Abstract

Overview - IEC 60444-6:2021 (Measurement of Drive Level Dependence, DLD)

IEC 60444-6:2021 is Part 6 of the IEC 60444 series on the measurement of quartz crystal unit parameters. It defines standardized procedures to measure drive level dependence (DLD) of quartz crystal units - how frequency and equivalent resistance change with the electrical drive level applied to a resonator. This third edition (2021) updates measurement content and clarifies applicability beyond AT-cut crystals to other cuts and vibration modes (doubly rotated cuts, tuning forks).

Key topics and technical requirements

Scope: Measurement of reversible and irreversible DLD effects on quartz crystal units; applicable across the frequency range covered by the part.
DLD effects: Defines and distinguishes reversible changes (repeatable with level cycling) and irreversible changes (permanent shifts after high-level exposure). Lists typical causes such as surface contamination, electrode or mounting defects, gas inclusions and mechanical stresses.
Drive level selection: Requires use of a defined low level and a nominal/high level (the latter representing steady-state application conditions). Annex A relates electrical drive level to mechanical displacement of the resonator.
Measurement methods:
- Method A (fast standard method): Based on the π‑network (per IEC 60444-5); suitable for the complete frequency range.
- Reference Method B (multi‑level reference): Uses π‑network or reflection methods (IEC 60444-5 or IEC 60444-8); intended as a high-accuracy reference.
- Method C (oscillator method): Oscillator-based test for fundamental-mode units and high-volume screening under fixed conditions (described in Annex B).
Documentation and limits: Specifies test sequences (two-level and multi-level options), acceptable measurement accuracy, and guidance on interpreting resistance/frequency ratios and test limits.

Applications - who uses IEC 60444-6 and why

Crystal and TCXO/OCXO manufacturers: for production test, screening and specification of drive-level behaviour.
Quality assurance and failure analysis labs: to detect irreversible DLD problems originating from fabrication or contamination.
Component suppliers and OEMs (telecom, automotive, IoT, instrumentation): to ensure oscillator stability and compliance with system-level drive conditions.
Test engineers and metrologists: for reproducible DLD characterization and to select appropriate test fixtures and measurement chains.

Related standards

IEC 60444-1: Basic π‑network zero phase technique for resonance frequency and resistance.
IEC 60444-5: Equivalent electrical parameter determination using network analyzer techniques and error correction.
IEC 60444-8: Test fixtures for surface-mounted quartz crystal units.
The IEC 60444 series provides complementary guidance for comprehensive quartz crystal unit parameter measurement.

Keywords: IEC 60444-6, drive level dependence, DLD, quartz crystal units, π‑network, oscillator method, crystal measurement, AT‑cut, doubly rotated cuts.

Related standards

Standards mentioned in the description

Abstract

Overview - IEC 60444-6:2021 (Measurement of Drive Level Dependence, DLD)

Key topics and technical requirements

Scope: Measurement of reversible and irreversible DLD effects on quartz crystal units; applicable across the frequency range covered by the part.
DLD effects: Defines and distinguishes reversible changes (repeatable with level cycling) and irreversible changes (permanent shifts after high-level exposure). Lists typical causes such as surface contamination, electrode or mounting defects, gas inclusions and mechanical stresses.
Drive level selection: Requires use of a defined low level and a nominal/high level (the latter representing steady-state application conditions). Annex A relates electrical drive level to mechanical displacement of the resonator.
Measurement methods:
- Method A (fast standard method): Based on the π‑network (per IEC 60444-5); suitable for the complete frequency range.
- Reference Method B (multi‑level reference): Uses π‑network or reflection methods (IEC 60444-5 or IEC 60444-8); intended as a high-accuracy reference.
- Method C (oscillator method): Oscillator-based test for fundamental-mode units and high-volume screening under fixed conditions (described in Annex B).
Documentation and limits: Specifies test sequences (two-level and multi-level options), acceptable measurement accuracy, and guidance on interpreting resistance/frequency ratios and test limits.

Applications - who uses IEC 60444-6 and why

Crystal and TCXO/OCXO manufacturers: for production test, screening and specification of drive-level behaviour.
Quality assurance and failure analysis labs: to detect irreversible DLD problems originating from fabrication or contamination.
Component suppliers and OEMs (telecom, automotive, IoT, instrumentation): to ensure oscillator stability and compliance with system-level drive conditions.
Test engineers and metrologists: for reproducible DLD characterization and to select appropriate test fixtures and measurement chains.

Related standards

IEC 60444-1: Basic π‑network zero phase technique for resonance frequency and resistance.
IEC 60444-5: Equivalent electrical parameter determination using network analyzer techniques and error correction.
IEC 60444-8: Test fixtures for surface-mounted quartz crystal units.
The IEC 60444 series provides complementary guidance for comprehensive quartz crystal unit parameter measurement.

Keywords: IEC 60444-6, drive level dependence, DLD, quartz crystal units, π‑network, oscillator method, crystal measurement, AT‑cut, doubly rotated cuts.

IEC 60444-6:2021 PDF

Technical details

Abstract

Overview - IEC 60444-6:2021 (Measurement of Drive Level Dependence, DLD)

Key topics and technical requirements

Applications - who uses IEC 60444-6 and why

Related standards

Related standards

Abstract

Overview - IEC 60444-6:2021 (Measurement of Drive Level Dependence, DLD)

Key topics and technical requirements

Applications - who uses IEC 60444-6 and why

Related standards

Related standards

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