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IEC 60747-18-1:2019 PDF

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

First page of standard IEC 60747-18-1:2019Open preview (PDF)Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Title (English):
IEC 60747-18-1:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
26
Publication date:
May 20, 2019
Edition:
IEC IS 60747 edition 1 version 1
ICS:
17.220.20
Description (English):

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

Technical details

Technical committee
SC 47E - Discrete semiconductor devices
SKU
IEC 60747-18-1:2019

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