Overview
IEC 60747-5-4:2006 is an international standard published by the International Electrotechnical Commission (IEC) focusing on semiconductor devices, specifically discrete optoelectronic devices known as semiconductor lasers or laser diodes. This standard defines key terminology, essential ratings, characteristics, and measurement methods relevant to semiconductor lasers. Applicable to manufacturers, testing laboratories, and users of these devices, IEC 60747-5-4 enables consistent classification, specification, and quality evaluation of semiconductor lasers used in various optical and electronic applications.
Key Topics
- Terminology and Definitions
The standard provides precise definitions for physical concepts related to electromagnetic radiation, visible and infrared light, and the construction of semiconductor lasers. This ensures a common language for device specification and testing globally.
- Essential Ratings and Characteristics
Guidance on the specification of limiting values (absolute maximum ratings) and key optical and electrical characteristics such as:
- Type of semiconductor material and device structure
- Details of outline drawing and encapsulation
- Switching times: rise time, fall time, turn-on and turn-off times
- Output optical power and wavelength dependencies
- Stability and lifetime characteristics of the device
- Measuring Methods
Standardized procedures for measuring critical parameters, including:
- Optical power output and stability
- Time-domain profiles (i.e. pulse response)
- Beam characteristics (direction, angle, divergence)
- Lifetime and reliability assessments
Applications
IEC 60747-5-4 is essential for a range of industries and sectors where semiconductor lasers are applied, including:
- Telecommunications:
Used in optical fiber communication systems, laser diodes are central to high-speed data transmission. Standardized ratings and measurement methods ensure device interoperability and reliability.
- Consumer Electronics:
Devices such as CD/DVD/Blu-ray players, barcode scanners, and printers incorporate semiconductor lasers, making standardized specifications important for product quality and safety.
- Industrial and Medical Equipment:
Laser processing, material inspection, and certain types of medical diagnostics rely on consistent laser performance as outlined by this standard.
- Research and Development:
Laboratories and test houses use these guidelines for device comparison, development, and reporting, ensuring accuracy and repeatability in experimental setups.
By defining measurement methods and essential parameters, IEC 60747-5-4 supports manufacturers and users in evaluating device suitability for specific use cases, improving device safety, and facilitating international trade and market access.
Related Standards
For comprehensive conformity and up-to-date testing practices, IEC 60747-5-4 should be used alongside the following standards:
- IEC 62007-1: Essential ratings and characteristics of semiconductor optoelectric devices for fiber optic system applications
- IEC 62007-2: Measurement methods for semiconductor optoelectric devices in fiber optic systems
- ISO 11145, ISO 11146 Series: Vocabulary, symbols, and measurement methods for laser beam characteristics
- ISO 11554: Test methods for laser beam power, energy, and temporal characteristics
- ISO 11670, ISO 12005, ISO 13694, ISO 13695, ISO 17526: Standards addressing laser beam stability, polarization, power distribution, spectral characteristics, and lifetime
Referencing and applying these related documents ensures thorough and harmonized implementation of semiconductor laser testing and classification procedures.
Keywords: IEC 60747-5-4, semiconductor lasers, laser diode standard, optoelectronic device standards, laser measurement methods, optical device ratings, IEC laser diode characterization, discrete semiconductor devices, international laser standards.
Open preview (PDF)Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
