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IEC 60747-5-9:2019 PDF

Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

First page of standard IEC 60747-5-9:2019Open preview (PDF)Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
Title (English):
IEC 60747-5-9:2019

Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
19
Publication date:
December 11, 2019
Edition:
IEC IS 60747 edition 1 version 1
ICS:
31.080.99
Description (English):

IEC 60747-5-9:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the relative external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an operating temperature, which is called temperature-dependent electroluminescence (TDEL). In order to identify the reference IQE of 100 %, the maximum values of the peak EQE are found by varying the environmental temperature and current.

Technical details

Technical committee
SC 47E - Discrete semiconductor devices
SKU
IEC 60747-5-9:2019

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