Overview
IEC 60748-4-3:2006 - "Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)" specifies measuring methods, terminology and requirements for testing ADCs under dynamic conditions. The standard defines how to obtain time-domain output records from ADCs, convert them to the frequency domain (FFT) and quantify dynamic performance including distortion, noise and spurious outputs. It covers both single-frequency (sinusoidal) and wideband test methods and explains relevant terms such as coherent sampling, equivalent-time sampling, and signal-dependent timing error.
Key topics
- Scope and purpose: dynamic testing methods and requirements for ADC characterization under realistic operating (time-varying) inputs.
- Test methods
- Sinusoidal (single-tone) testing - coherent sampling, FFT-based analysis to derive SINAD, THD, SFDR and SNR.
- Wideband testing - pseudo-random binary sequence (PRBS) or other wideband excitations to better represent typical amplitude probability density functions (APDF) and reveal APDF-dependent linearity effects.
- Measured characteristics
- Settling time, overload recovery and rise/fall times
- Linearity: total linearity error, differential linearity error (DNL)
- Dynamic distortion and noise metrics: THD, SINAD, SFDR, SNR, noise floor, effective number of bits (ENOB / Nef)
- Signal-dependent timing error and spurious frequencies
- Word error rate for non-random errors
- Measurement setup: recommended test arrangement (clock source, filters, waveform generators, ADC under test, capture buffer and computer) and guidance on record sizing and analysis (time-domain records → FFT).
Applications and users
IEC 60748-4-3 is intended for:
- ADC and semiconductor manufacturers - to qualify dynamic performance during design verification and production test.
- Test laboratories and QA teams - for standardized evaluation of ADC dynamic metrics.
- System integrators and designers - to select ADCs for communications, audio, instrumentation, medical, and data-acquisition systems where dynamic accuracy is critical.
- Standards and compliance engineers - to harmonize ADC test reporting and compare devices using common metrics (SINAD, SFDR, ENOB).
Practical benefits include more realistic performance assessment using wideband stimuli (PRBS) and clear definitions of sampling techniques (coherent and equivalent-time sampling) that directly affect measured ENOB, distortion and spurious behavior.
Related standards
- IEC 60748-4:1997 - general test methods for interface integrated circuits (Category II); referenced normative baseline.
- IEC 60268-10:1991 - sound system equipment - peak programme level meters (referenced for measurement practice).
Keywords: IEC 60748-4-3, ADC dynamic testing, analogue-digital converters, SINAD, SFDR, ENOB, SNR, THD, coherent sampling, wideband testing, APDF, pseudo-random binary sequence.
Open preview (PDF)Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
