IEC 60749-10:2002 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shockTitle (English):
IEC 60749-10:2002
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
- Document status:
- Active
- Format:
- Electronic (PDF)
- Number of pages:
- 7
- Publication date:
- April 9, 2002
- Edition:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
Description (English):
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
Technical details
- Technical committee
- TC 47 - Semiconductor devices
- SKU
- IEC 60749-10:2002
