IEC 60749-36:2003 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady stateTitle (English):
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
- Document status:
- Active
- Format:
- Electronic (PDF)
- Number of pages:
- 7
- Publication date:
- February 13, 2003
- Edition:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
Description (English):
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Technical details
- Technical committee
- TC 47 - Semiconductor devices
- SKU
- IEC 60749-36:2003
