Перейти к содержимому
Low prices. Originals and translations — save time and budget.

IEC 60749-39:2006 PDF

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

First page of standard IEC 60749-39:2006Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Title (English):
IEC 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
19
Publication date:
July 24, 2006
Edition:
IEC IS 60749 edition 1 version 1
ICS:
31.080.01
Description (English):

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

Technical details

Technical committee
TC 47 - Semiconductor devices
SKU
IEC 60749-39:2006

This site uses cookies and visit counters for operation and statistics. Privacy policy