IEC 60749-43:2017 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
Open preview (PDF)Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plansTitle (English):
IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
- Format:
- Electronic (PDF)
- Number of pages:
- 74
- Publication date:
- June 15, 2017
- Edition:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
- Technical committee:
- TC 47 - Semiconductor devices
Description (English):
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Technical details
- SKU
- IEC 60749-43:2017
