Overview
IEC 61788-17:2013 is an international standard published by the International Electrotechnical Commission (IEC) that focuses on the measurement of local critical current density (Jc) and its distribution across large-area high-temperature superconducting (HTS) films. This standard defines an inductive measurement method using third-harmonic voltages to assess superconducting films at liquid nitrogen temperatures without applied DC magnetic fields. The key parameter measured is the critical sheet current, which represents the product of local Jc and the film thickness.
Precise and reproducible evaluation of superconducting films is critical for advancing HTS applications in electronics, telecommunications, and energy systems. IEC 61788-17:2013 provides detailed procedures, apparatus specifications, and uncertainty analysis to support consistent testing and quality control in research and industrial environments.
Key Topics
-
Local Critical Current Density Measurement: The standard specifies an inductive method to evaluate the local critical current density, Jc, an essential parameter that characterizes the superconducting performance of HTS films.
-
Third-Harmonic Voltage Technique: Measurements use third-harmonic voltages induced in coils placed near the superconducting film, enabling non-contact analysis with high spatial resolution.
-
Frequency-Dependent Current-Voltage Characteristics: Accurate Jc determination relies on analyzing the frequency dependence of voltage responses, applying an electric-field criterion at liquid nitrogen temperatures (~77 K).
-
Measurement Range and Resolution: The standard covers sheet current densities (Jc × thickness) from 200 A/m to 32 kA/m with a measurement resolution of 100 A/m, supporting detailed mapping of film uniformity.
-
Measurement Setup and Calibration: IEC 61788-17 describes coil design, sample mounting, and calibration procedures using reference wafers to determine coil coefficients for precise quantification.
-
Uncertainty and Test Reporting: The document addresses systematic effects affecting measurement accuracy, including coil-to-film distance variations, and prescribes rigorous test reporting requirements for reproducibility.
Applications
IEC 61788-17:2013 is applicable to industries and research sectors utilizing high-temperature superconducting films, including:
-
Superconducting Electronics Manufacture: Supports development and quality assurance of HTS devices such as microwave filters, SQUIDs (superconducting quantum interference devices), and Josephson junctions.
-
Material Research and Development: Assists scientists in characterizing superconducting films for improved performance, durability, and fabrication methods.
-
Power Systems and Energy Storage: Enables evaluation of superconducting layers used in cables, fault current limiters, and magnetic energy storage systems.
-
Telecommunications Equipment: Facilitates reliable production of HTS filters and components that leverage low insertion loss and high frequency selectivity.
-
Standardized Testing Facilities: Provides a globally recognized method for uniform characterization, contributing to harmonized quality standards and certification processes.
By employing this standard, stakeholders can ensure consistent, accurate assessment of superconducting films' critical current properties, driving innovation and commercial adoption of HTS technologies.
Related Standards
IEC 61788-17:2013 is part of the broader IEC 61788 series on superconductivity, which includes multiple parts addressing various aspects of superconducting materials and technologies:
-
IEC 61788-1: General terms and definitions related to superconductivity.
-
IEC 61788-2: Measurement techniques for critical parameters of superconductors.
-
IEC 61788-13: Methods for characterizing critical current in coated conductors.
-
Other parts of IEC 61788: Cover additional electronic characteristic measurements and superconducting device testing protocols.
For comprehensive understanding and implementation, users should consult related IEC publications and standards addressing superconducting materials' terminology, calibration methods, and test system configurations. These harmonized standards support consistent global practices in the evaluation and utilization of superconducting films and devices.
Keywords: IEC 61788-17, superconductivity standard, local critical current density, HTS films, superconducting film measurement, third-harmonic voltage, inductive measurement, critical sheet current, high-temperature superconductors, superconductivity testing, liquid nitrogen temperature, measurement uncertainty, superconducting electronics, HTS device characterization.
Open preview (PDF)Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
