Overview
IEC 61987-41:2025 is an International Standard developed by the International Electrotechnical Commission (IEC) for the industrial-process measurement and control sector. It focuses on the standardization of data structures and elements in process equipment catalogues, specifically targeting process analysers. This part of the IEC 61987 series specifies generic structures for Lists of Properties (LOPs) of process analysers to enable consistent and reliable electronic data exchange. By defining Operating Lists of Properties (OLOPs), Device Lists of Properties (DLOPs), and Lists of Properties for Dynamic Data (LOPDs), this standard facilitates efficient device integration and data management, both within organizations and across the industrial automation supply chain.
Key Topics
Integration in the Common Data Dictionary (CDD)
- Provides a characterization framework for process analysers within the IEC Common Data Dictionary.
- Ensures harmonized terminology and classification, essential for the digital transformation and interoperability in industrial automation.
Generic Structures for OLOPs and DLOPs
- Operating List of Properties (OLOP): Defines structure for describing operational and environmental conditions relevant to process analysers, such as ambient conditions, base conditions, and physical properties at sampling points.
- Device List of Properties (DLOP): Specifies device-related properties including identification, function, performance, design, and compliance. Enables detailed device documentation and supports digital catalogues.
Dynamic Data for Condition Monitoring (LOPD)
- Describes how to structure and catalogue dynamic properties (e.g., those that change over time), necessary for condition monitoring and predictive maintenance.
- Facilitates the tracking and electronic exchange of real-time device statuses and variables.
Cardinality and Polymorphism
- Supports flexible data modelling by allowing property blocks to be repeated or selected from alternatives, ensuring adaptability to diverse device configurations.
Applications
This standard offers substantial practical benefits for various stakeholders in the process industry:
- Manufacturers: Standardized properties and structures allow manufacturers of process analysers to provide clear, interoperable product information across digital platforms and catalogues.
- System Integrators: Ensures easier integration of process analysers into plant systems and enterprise resource planning (ERP) tools, reducing duplication and enabling automated data exchange.
- Plant Operators and Owners: Facilitates condition monitoring and supports asset management by ensuring consistent and authoritative device information is available throughout the equipment lifecycle.
- Procurement and Engineering: Supports procurement, commissioning, and maintenance workflows by providing a common language and structure for device properties, specifications, and documentation.
- Smart Manufacturing and IIoT: Lays the groundwork for advanced digital solutions in the Industrial Internet of Things (IIoT) and smart manufacturing by enabling standardized, semantic-rich data exchange.
Related Standards
IEC 61987-41:2025 is part of a larger framework of IEC standards focused on process measurement and control. Relevant standards include:
- IEC 61987-1: Provides generic structures for measuring equipment and forms the basis for DLOPs.
- IEC 61987-10: Fundamental principles for list of properties (LOPs) and structure elements for electronic data exchange.
- IEC 61987-11: Defines generic structures for measuring equipment, including handling of composite or complex devices.
- IEC Common Data Dictionary (IEC CDD): Central repository of standardized data models and terminology for industrial process automation.
By implementing IEC 61987-41:2025, companies can achieve greater interoperability, improved data quality, and streamlined processes in industrial automation, supporting the goals of digital transformation and smart manufacturing.
