IEC 62396-3:2013 PDF

Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation

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Title (English):

IEC 62396-3:2013

Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 28
Publication date:: September 25, 2013
Edition:: IEC IS 62396 edition 1 version 1
ICS:: 03.100.50

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Description (English):

IEC 62396-3:2013(E) provides guidance and furthermore it provides necessary requirements for those involved in the design of avionic systems and equipment and the resultant effects of atmospheric radiation-induced single event effects (SEE) on those avionic systems. The outputs of the activities and objectives described in this part of IEC 62396 will become inputs to higher level certification activities and required evidences. It builds on the initial guidance on the system level approach to single event effects in IEC 62396-1:2012, considers some avionic systems and provides basic methods to accommodate SEE so that system development assurance levels are met.

Technical details

Technical committee: TC 107 - Process management for avionics
SKU: IEC 62396-3:2013

Abstract

Overview

IEC 62396-3:2013 - "Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation" provides guidance and requirements for designing avionics systems to manage the effects of atmospheric radiation-induced single event effects (SEE). It builds on the system-level approach in IEC 62396-1:2012 and defines outputs and evidence that feed higher-level certification and safety assurance activities. The standard aims to ensure system development assurance levels are met while minimizing hard and soft fault impacts on aircraft functionality and reliability.

Key Topics and Requirements

Process guidance (Clause 4): Establishes procedures and activities for integrating SEE accommodation into the avionics design process.
Atmospheric radiation and electronic system faults (Clause 5): Describes how atmospheric radiation produces hard faults (permanent damage) and soft faults (transient or recoverable errors) and introduces relevant terminology (e.g., latch‑up, firm error, ASET, MBU/MCU).
Aircraft safety assessment (Clause 6): Presents a methodology for assessing SEE contribution to system failure rates, defines mitigation strategies, and maps recommendations to system assurance levels (Levels A–E).
System-specific guidance: Considers different avionics systems (Levels A–E) and provides tailored optimization methods to reach required reliability targets (MTBF, MTBUR).
Informative annexes: Include a design process flow diagram for SEE rates (Annex A), mitigation method considerations (Annex B), and example systems (Annex C).

Practical Applications - Who Uses This Standard

IEC 62396-3 is intended for:

Avionics systems engineers and architects designing robust flight-critical electronics.
Component and equipment manufacturers developing LRUs (line replaceable units) and ICs sensitive to radiation.
Safety assessors and certification teams preparing evidence for regulatory compliance and certification processes.
Reliability and maintenance planners addressing MTBF/MTBUR impacts and in-service removal rates.
Airlines and integrators concerned with operational reliability and lifecycle costs influenced by SEE.

Use cases include optimizing redundancy and diagnostics, defining test and verification inputs for certification, and deriving system-level fault-rate allocations that incorporate atmospheric radiation effects.

Related Standards and References

IEC 62396-1:2012 - Accommodation of atmospheric radiation effects at the equipment level.
IEC/TS 62239-1 - Preparation and maintenance of an electronic components management plan.
ARP4754 - System development and safety assessment methodology referenced for fault-rate accommodation.

Keywords: IEC 62396-3, single event effects, SEE, atmospheric radiation, avionics, system design optimization, aircraft safety assessment, MTBF, MTBUR, LRU, mitigation methods.

Related standards

Other IEC standards

Abstract

Overview

Key Topics and Requirements

Process guidance (Clause 4): Establishes procedures and activities for integrating SEE accommodation into the avionics design process.
Atmospheric radiation and electronic system faults (Clause 5): Describes how atmospheric radiation produces hard faults (permanent damage) and soft faults (transient or recoverable errors) and introduces relevant terminology (e.g., latch‑up, firm error, ASET, MBU/MCU).
Aircraft safety assessment (Clause 6): Presents a methodology for assessing SEE contribution to system failure rates, defines mitigation strategies, and maps recommendations to system assurance levels (Levels A–E).
System-specific guidance: Considers different avionics systems (Levels A–E) and provides tailored optimization methods to reach required reliability targets (MTBF, MTBUR).
Informative annexes: Include a design process flow diagram for SEE rates (Annex A), mitigation method considerations (Annex B), and example systems (Annex C).

Practical Applications - Who Uses This Standard

IEC 62396-3 is intended for:

Avionics systems engineers and architects designing robust flight-critical electronics.
Component and equipment manufacturers developing LRUs (line replaceable units) and ICs sensitive to radiation.
Safety assessors and certification teams preparing evidence for regulatory compliance and certification processes.
Reliability and maintenance planners addressing MTBF/MTBUR impacts and in-service removal rates.
Airlines and integrators concerned with operational reliability and lifecycle costs influenced by SEE.

Related Standards and References

IEC 62396-1:2012 - Accommodation of atmospheric radiation effects at the equipment level.
IEC/TS 62239-1 - Preparation and maintenance of an electronic components management plan.
ARP4754 - System development and safety assessment methodology referenced for fault-rate accommodation.

Keywords: IEC 62396-3, single event effects, SEE, atmospheric radiation, avionics, system design optimization, aircraft safety assessment, MTBF, MTBUR, LRU, mitigation methods.

IEC 62396-3:2013 PDF

Technical details

Abstract

Overview

Key Topics and Requirements

Practical Applications - Who Uses This Standard

Related Standards and References

Related standards

Abstract

Overview

Key Topics and Requirements

Practical Applications - Who Uses This Standard

Related Standards and References

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