IEC 62396-4:2013 PDF

Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

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Title (English):

IEC 62396-4:2013

Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 18
Publication date:: September 25, 2013
Edition:: IEC IS 62396 edition 1 version 1
ICS:: 03.100.50

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Description (English):

IEC 62396-4:2013(E) provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). This part of IEC 62396 defines the effects of that environment on high voltage electronics and provides design considerations for the accommodation of those effects within avionics systems. This part of IEC 62396 provides technical data and methodology for aerospace equipment manufacturers and designers to standardise their approach to single event effects on high voltage avionics by providing guidance, leading to a standard methodology. This publication is to be read in conjunction with IEC 62396-1:2012.

Technical details

Technical committee: TC 107 - Process management for avionics
SKU: IEC 62396-4:2013

Abstract

Overview

IEC 62396-4:2013 - Process management for avionics - Atmospheric radiation effects - Part 4 provides guidance for the design of high voltage aircraft electronics (nominally >200 V) to manage atmospheric radiation-induced failures at altitudes up to 60 000 ft (18.3 km). Intended as a complement to IEC 62396-1:2012, this part focuses on the physics, quantification and mitigation of radiation-driven destructive events in high-voltage power semiconductors used in avionics.

Key topics and technical requirements

Primary failure mechanisms: Describes and distinguishes single event burnout (SEB) and single event gate rupture (SEGR) as the main radiation-induced threats to high voltage MOSFETs, IGBTs, diodes and bipolar power devices.
Radiation sources and sensitivity: Explains that SEB/SEGR can be triggered by heavy ions, high-energy protons and high-energy/thermal neutrons, and highlights the greater atmospheric neutron flux at flight altitudes vs. sea level.
Quantification and testing guidance:
- Methodology for measuring SEB cross-sections and calculating SEB rates for aircraft altitudes.
- Use of accelerated test data (e.g., spallation neutron facilities such as the WNR beam) and interpretation guidance for avionics.
- Measurement techniques for event charge/current (EPICS plots and event statistics) and discussion of how stress (applied voltage) affects event rates.
Design considerations: Guidance for accommodating radiation effects at system and component levels, including conservative operating voltages and device selection strategies.
Additional topics: Treatment of thermal neutron-induced SEB, potential SEGR from recoil ions, and consideration of alternative semiconductor materials (e.g., non-silicon technologies).

Practical applications and users

Who should use IEC 62396-4:

Avionics system designers and aircraft electrical architects specifying high-voltage power electronics.
Electronic equipment and component manufacturers (power MOSFET, IGBT, diode vendors) validating device robustness to atmospheric radiation.
Aerospace qualification and test engineers conducting radiation testing, failure analysis and mitigation design. Practical uses:
Standardizing radiation testing approaches and reporting for high-voltage avionics components.
Informing design margins (operating voltages, protective circuitry) to reduce SEB/SEGR risk.
Integrating radiation risk assessments into avionics procurement and safety cases.

Related standards

IEC 62396-1:2012 - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment (required companion document).

Keywords: IEC 62396-4, atmospheric radiation effects, high voltage avionics, single event burnout (SEB), single event gate rupture (SEGR), neutron-induced effects, radiation testing, aircraft electronics, avionics standards.

Related standards

Other IEC standards

Abstract

Overview

Key topics and technical requirements

Primary failure mechanisms: Describes and distinguishes single event burnout (SEB) and single event gate rupture (SEGR) as the main radiation-induced threats to high voltage MOSFETs, IGBTs, diodes and bipolar power devices.
Radiation sources and sensitivity: Explains that SEB/SEGR can be triggered by heavy ions, high-energy protons and high-energy/thermal neutrons, and highlights the greater atmospheric neutron flux at flight altitudes vs. sea level.
Quantification and testing guidance:
- Methodology for measuring SEB cross-sections and calculating SEB rates for aircraft altitudes.
- Use of accelerated test data (e.g., spallation neutron facilities such as the WNR beam) and interpretation guidance for avionics.
- Measurement techniques for event charge/current (EPICS plots and event statistics) and discussion of how stress (applied voltage) affects event rates.
Design considerations: Guidance for accommodating radiation effects at system and component levels, including conservative operating voltages and device selection strategies.
Additional topics: Treatment of thermal neutron-induced SEB, potential SEGR from recoil ions, and consideration of alternative semiconductor materials (e.g., non-silicon technologies).

Practical applications and users

Who should use IEC 62396-4:

Avionics system designers and aircraft electrical architects specifying high-voltage power electronics.
Electronic equipment and component manufacturers (power MOSFET, IGBT, diode vendors) validating device robustness to atmospheric radiation.
Aerospace qualification and test engineers conducting radiation testing, failure analysis and mitigation design. Practical uses:
Standardizing radiation testing approaches and reporting for high-voltage avionics components.
Informing design margins (operating voltages, protective circuitry) to reduce SEB/SEGR risk.
Integrating radiation risk assessments into avionics procurement and safety cases.

Related standards

IEC 62396-1:2012 - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment (required companion document).

IEC 62396-4:2013 PDF

Technical details

Abstract

Overview

Key topics and technical requirements

Practical applications and users

Related standards

Related standards

Abstract

Overview

Key topics and technical requirements

Practical applications and users

Related standards

Related standards

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