IEC 62884-2:2017 PDF

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Open preview (PDF)

Title (English):

IEC 62884-2:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 24
Publication date:: August 30, 2017
Edition:: IEC IS 62884 edition 1 version 1
ICS:: 31.140

Delivery type:

Full version35 €Read online 24h10 €Read online 72h15 €

Document language:

enru

Delivery time:Immediate download

Price:35 €

Description (English):

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

Technical details

Technical committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
SKU: IEC 62884-2:2017

Abstract

Overview

IEC 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators: Part 2: Phase jitter measurement method - defines standard methods to measure and evaluate phase jitter of oscillators (including crystal, dielectric resonator oscillators (DROs) and FBAR-based oscillators). The standard prescribes using phase noise measurement equipment or a phase-noise measurement system and gives guidance to obtain accurate RMS jitter values and other jitter metrics.

Key topics

Scope and targets
- Measurement procedures specifically for piezoelectric, dielectric and electrostatic oscillators, with guidance for DROs and thin-film bulk acoustic resonator (FBAR) oscillators.
Measurement domains
- Procedures for measuring phase jitter in the time domain, data domain, and frequency domain (phase-noise-based methods).
Equipment and setup
- Use of phase noise analyzers, sampling oscilloscopes, and jitter/wander analysers (e.g., block diagrams referenced to ITU-T practices).
- Requirements on input/output impedances, output waveform, output voltage, and jitter floor of measurement systems.
Test procedures and environment
- Pre-test setup and configuration, measurement under reference temperature, temperature-characteristics testing, measurement under vibration, impact, and accelerated ageing.
Calculation and analysis
- Normative Annex A: calculation methods linking phase noise (SSB phase noise) to phase jitter metrics - RMS jitter, peak-to-peak, random vs deterministic jitter, and total jitter.
Measurement integrity
- Guidance on test fixtures, cables, instruments, error sources, and factors affecting measurement uncertainty.
Document structure
- Normative references and terminology aligned with related IEC and ISO vocabularies.

Applications

IEC 62884-2:2017 is useful for:

Oscillator manufacturers validating phase jitter performance for product datasheets and customer delivery.
Test laboratories standardizing measurement procedures and reporting reproducible RMS jitter and phase-noise-derived metrics.
RF and system engineers designing communications, satellite, automotive, EV control and timing systems where low jitter/phase noise is critical.
Quality and compliance teams performing environmental and ageing tests (temperature, vibration, impact, accelerated ageing) to assess long-term oscillator stability.

Related standards

IEC 62884-1:2017 - Basic measurement methods for oscillators
IEC 60679-1:2017 - Generic specifications for oscillators of assessed quality
IEC 60027, IEC 60050-561, IEC 60469, ISO 80000-1 - referenced terminology and units

Keywords: IEC 62884-2:2017, phase jitter measurement, phase noise, oscillator testing, DRO, FBAR, RMS jitter, jitter measurement methods.

Related standards

Standards mentioned in the description

Abstract

Overview

Key topics

Scope and targets
- Measurement procedures specifically for piezoelectric, dielectric and electrostatic oscillators, with guidance for DROs and thin-film bulk acoustic resonator (FBAR) oscillators.
Measurement domains
- Procedures for measuring phase jitter in the time domain, data domain, and frequency domain (phase-noise-based methods).
Equipment and setup
- Use of phase noise analyzers, sampling oscilloscopes, and jitter/wander analysers (e.g., block diagrams referenced to ITU-T practices).
- Requirements on input/output impedances, output waveform, output voltage, and jitter floor of measurement systems.
Test procedures and environment
- Pre-test setup and configuration, measurement under reference temperature, temperature-characteristics testing, measurement under vibration, impact, and accelerated ageing.
Calculation and analysis
- Normative Annex A: calculation methods linking phase noise (SSB phase noise) to phase jitter metrics - RMS jitter, peak-to-peak, random vs deterministic jitter, and total jitter.
Measurement integrity
- Guidance on test fixtures, cables, instruments, error sources, and factors affecting measurement uncertainty.
Document structure
- Normative references and terminology aligned with related IEC and ISO vocabularies.

Applications

IEC 62884-2:2017 is useful for:

Oscillator manufacturers validating phase jitter performance for product datasheets and customer delivery.
Test laboratories standardizing measurement procedures and reporting reproducible RMS jitter and phase-noise-derived metrics.
RF and system engineers designing communications, satellite, automotive, EV control and timing systems where low jitter/phase noise is critical.
Quality and compliance teams performing environmental and ageing tests (temperature, vibration, impact, accelerated ageing) to assess long-term oscillator stability.

Related standards

IEC 62884-1:2017 - Basic measurement methods for oscillators
IEC 60679-1:2017 - Generic specifications for oscillators of assessed quality
IEC 60027, IEC 60050-561, IEC 60469, ISO 80000-1 - referenced terminology and units

Keywords: IEC 62884-2:2017, phase jitter measurement, phase noise, oscillator testing, DRO, FBAR, RMS jitter, jitter measurement methods.

IEC 62884-2:2017 PDF

Technical details

Abstract

Overview

Key topics

Applications

Related standards

Related standards

Abstract

Overview

Key topics

Applications

Related standards

Related standards

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for…

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

Amendment 2 - Letter symbols to be used in electrical technology - Part 1: General

Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and elect…

Transitions, pulses and related waveforms - Terms, definitions and algorithms

Quantities and units - Part 11: Characteristic numbers - Amendment 1 (ISO 80000-11:2019/Amd 1:2025)