Перейти к содержимому
Low prices. Originals and translations — save time and budget.

IEC 63003:2015 PDF

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

First page of standard IEC 63003:2015Open preview (PDF)Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
Title (English):
IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
162
Publication date:
December 14, 2015
Edition:
IEEE IS 63003 edition 1 version 1
ICS:
01
Description (English):

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Technical details

Technical committee
TC 91 - Electronics assembly technology
SKU
IEC 63003:2015

This site uses cookies and visit counters for operation and statistics. Privacy policy