Overview
IEC 63202-1:2019 is an international standard published by the International Electrotechnical Commission (IEC) that specifies procedures for the measurement of light-induced degradation (LID) in crystalline silicon photovoltaic (PV) cells. LID is a key factor affecting the power output and performance reliability of crystalline silicon solar cells. This standard details a consistent methodology for assessing LID using simulated sunlight, ensuring accurate comparison of PV cell output at Standard Test Conditions (STC) before and after exposure to controlled irradiation and temperature.
The purpose of IEC 63202-1:2019 is to provide PV manufacturers and testing laboratories with standardized information concerning LID, supporting efforts to minimize mismatch between cells in a PV module and thus optimize total module power yield.
Key Topics
- Light-Induced Degradation (LID): The process in which crystalline silicon photovoltaic cells experience a reduction in performance when exposed to light, particularly under specific temperature and irradiance conditions.
- Test Procedure: Steps to assess LID, focusing on comparing maximum output power before and after controlled sunlight simulation, following parameters such as temperature, irradiance, and exposure duration.
- Sampling Requirements: Guidance on selecting and handling a minimum of twenty PV cells from the same production batch for consistent results.
- Apparatus and Environmental Control: Use of calibrated solar simulators (as per IEC 60904-9) and environmental chambers to maintain precise conditions during testing.
- Data Reporting: Specification of required information to include in LID test reports, such as initial and final power and current values, exposure levels, stabilization status, and statistical analysis where applicable.
Applications
Implementing IEC 63202-1:2019 is essential for:
- PV Cell and Module Manufacturers: Ensuring uniformity and predictability in PV cell performance helps to minimize mismatch losses within a module, leading to greater overall efficiency and power output.
- Quality Assurance: Provides a reliable framework for testing the quality and longevity of crystalline silicon PV cells, supporting product guarantees and certifications.
- Research and Development: Facilitates the comparison of LID resistance between different cell technologies and process variations, driving innovation in PV cell manufacturing.
- Testing Laboratories: Enables standardized procedures for third-party testing, supporting the photovoltaic industry's requirements for consistent performance measurement and benchmarking.
Related Standards
IEC 63202-1:2019 should be used in conjunction with other key photovoltaic standards, including:
- IEC 60904-1: Photovoltaic devices - Part 1: Measurements of photovoltaic current-voltage characteristics. Sets out how to measure I-V curves.
- IEC 60904-2: Photovoltaic devices - Part 2: Requirements for photovoltaic reference devices. Specifies requirements for reference solar cells used in calibration.
- IEC 60904-9: Photovoltaic devices - Part 9: Solar simulator performance requirements. Details performance for simulators used in testing.
- IEC 61215 Series: Standards for design qualification and type approval of PV modules, which include module-level LID measurement protocols.
By following IEC 63202-1:2019, PV industry professionals can enhance module performance, support quality assurance processes, and meet evolving international requirements for solar energy technology. Standardized LID measurement helps ensure that PV systems deliver reliable, maximum power output throughout their operational lifetime.
Open preview (PDF)Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
