Overview
ISO 15932:2013 - Microbeam analysis - Analytical electron microscopy - Vocabulary - is an international vocabulary standard that defines and organizes the terminology used in the practice of analytical electron microscopy (AEM). Rather than prescribing methods, this standard provides consistent, hierarchical definitions of terms that appear across AEM practice and related fields (e.g. TEM, STEM, SEM, EPMA, EDX). ISO 15932:2013 is intended for use in standardization documents, technical reports, instrument documentation, and scientific communication.
Key topics
ISO 15932:2013 structures AEM terminology into clear topic areas, including:
- Abbreviated terms and commonly used acronyms (AEM, TEM, STEM, EELS, EDS/EDX, EPMA, HAADF, FIB, etc.).
- Physical basis of AEM: electron optics, electron sources, energy spread, coherence, electron scattering (elastic, inelastic), Bloch waves, plasmon loss and core loss.
- Instrumentation: electron gun types (thermionic, Schottky, field emission), brightness and reduced brightness, electron lens systems, excitation current, and common aberrations (spherical, chromatic, astigmatism).
- Specimen preparation and imaging fundamentals: definitions related to image formation and processing, high-resolution imaging modes (HREM, HAADF-STEM, LAADF-STEM, ABF-STEM), electron holography, and electron tomography.
- Image interpretation, analysis, measurement and calibration: terms for magnification, resolution, calibration procedures, and electron diffraction (including CBED).
- Systematic scope: vocabulary organized by hierarchy and applicability to other microbeam analysis standards.
Practical applications and users
ISO 15932:2013 supports accurate communication and consistent documentation across AEM workflows. Typical users:
- Electron microscopists and researchers who author publications, protocols, or lab reports.
- Instrument manufacturers and software developers creating manuals, user interfaces, and data formats.
- Standards developers and regulatory bodies harmonizing terminology across SEM, TEM, STEM, EPMA, and EDS/EDX standards.
- Laboratory managers and quality assurance professionals ensuring consistent terminology in SOPs and training.
- Educators and students learning microscopy concepts and vocabulary.
Benefits include improved clarity in technical reports, reproducible communications between labs, and better interoperability of instrument specifications and data.
Related standards
ISO 15932:2013 is part of a family of microbeam analysis standards developed by ISO/TC 202, including:
- ISO 22493 (scanning electron microscopy, SEM)
- ISO 23833 (electron probe microanalysis, EPMA)
- ISO 22309 (energy-dispersive X-ray spectrometry, EDS/EDX)
For authoritative references and the official text, consult the ISO online browsing platform or ISO publications for ISO 15932:2013.
