Overview
ISO 18115-2:2021 - Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy - is the ISO vocabulary standard that defines and clarifies terminology used for surface chemical analysis by scanning probe microscopy (SPM). This third edition (2021) is a minor revision of the 2013 edition and updates several terms (for example, replacing “Kelvin‑force microscopy” with Kelvin‑probe force microscopy). The document is prepared by ISO/TC 201/SC 1 and focuses on consistent, internationally agreed definitions to avoid ambiguity across disciplines.
Key topics
- Scope and purpose: Provides standardized terms and definitions specifically for SPM methods used in surface chemical analysis. It complements ISO 18115‑1, which covers general terms and spectroscopy.
- Structured vocabulary: Terms are organized into Clauses covering:
- SPM methods (Clause 3)
- Contact mechanics models (Clause 4)
- Scanning probe method terminology (Clause 5)
- Supplementary SPM methods (Clause 6)
- Supplementary terms for SPM (Clause 7)
- Examples of defined techniques and modes (vocabulary entries include AFM-related modes and SPM variants): AFM, NC‑AFM (non‑contact AFM), DFM/FM‑AFM (dynamic/frequency modulation), CPAFM (conductive‑probe AFM), KPFM (Kelvin‑probe force microscopy), MFM (magnetic‑force microscopy), NSOM/SNOM, MRFM, CITS, chemical‑force microscopy, photothermal micro‑spectroscopy (PTMS), and others.
- Ancillary content: Annex A lists abbreviated terms; an informative bibliography points to related literature. The standard contains no normative references.
- Terminology decisions: Notes clarify instrument vs. method usage (e.g., final “M” or “S” in acronyms may mean “microscopy/microscope” or “spectroscopy/spectrometer” depending on context).
Applications and users
Who benefits from ISO 18115‑2:
- Materials scientists, surface chemists, physicists working with AFM/STM/NSOM and other SPM techniques.
- Laboratory managers and instrument manufacturers who need consistent terminology for specifications, user manuals, and data reporting.
- Standards writers, educators, and technical authors preparing documentation, protocols, or training materials.
- Cross-disciplinary teams that require clear communication when exchanging surface analysis data.
Practical value:
- Ensures consistent naming and definitions across reports, papers, and instrument documentation.
- Reduces misunderstandings in method selection, data interpretation, and interlaboratory communication.
- Supports compliance, quality assurance, and traceable documentation in surface chemical analysis workflows.
Related standards
- ISO 18115‑1 (general vocabulary and spectroscopy terms) - complementary.
- Profilometry and surface texture standards mentioned in the introduction: ISO 3274, ISO 4287, ISO 25178 (for users needing deeper guidance on profile and texture measurement).
Keywords: ISO 18115-2, surface chemical analysis, scanning probe microscopy vocabulary, AFM terminology, SPM terms, Kelvin‑probe force microscopy, atomic force microscopy definitions.
Open preview (PDF)Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy