Перейти к содержимому
Low prices. Originals and translations — save time and budget.

ISO 6342:2003 PDF

Micrographics — Aperture cards — Method of measuring thickness of buildup area

First page of standard ISO 6342:2003Open preview (PDF)Micrographics — Aperture cards — Method of measuring thickness of buildup area
Title (English):
ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Document status:
Active
Format:
Electronic (PDF)
Number of pages:
3
Publication date:
July 15, 2003
Edition:
ISO IS 6342 edition 2 version 1
ICS:
37.080
Description (English):

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Technical details

Technical committee
ISO/TC 171 - Document management applications
SKU
ISO 6342:2003

This site uses cookies and visit counters for operation and statistics. Privacy policy